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TESTING APPARATUS FOR TESTING ELECTRICAL CIRCUIT B

来源:个人技术集锦
专利内容由知识产权出版社提供

专利名称:TESTING APPARATUS FOR TESTING

ELECTRICAL CIRCUIT BOARD HAVINGELECTRICAL CONNECTORS THEREON

发明人:YU-CHING LIU,PO-LIN SU,FU-CHI YANG,ZHI-JUN WANG,SHUN-TUNG CHEN,LI-QUANZHANG,WEI-DA YANG,JIE-PENG KANG

申请号:US14572398申请日:20141216

公开号:US20150331037A1公开日:20151119

专利附图:

摘要:A testing apparatus for testing a circuit board is disclosed, which includes anupper plate, a lower plate, and an adaptor circuit board. A plurality of positioning units isreceived in the lower plate. Each positioning unit has a plurality of length-variable testprobes secured therein. Each test probe has a shell and upper and lower probe ends atopposite ends of the shell. In test, the circuit board is put on the lower plate and theupper plate is lowered to push the circuit board and the lower plate toward the adaptorcircuit board. The upper ends of the test probes engage with electrical connectors of thecircuit board and the lower ends thereof engage with the adaptor circuit board wherebytest of the circuit board can be automatically performed by the testing apparatus.

申请人:HONGFUJIN PRECISION ELECTRONICS (ZHENGZHOU) CO., LTD.,HON HAIPRECISION INDUSTRY CO., LTD.

地址:Zhengzhou CN,New Taipei TW

国籍:CN,TW

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