专利名称：Device for measuring the interferences and
the inclinations of abutting surfaces of a halfplain bearing
发明人：MORISAKI; NOBUKAZU申请号：US47704974申请日：19740606公开号：US3864835A公开日：19750211
摘要：A measuring device capable of measuring simultaneously the averageinterferences and the inclinations of abutting surfaces of a bearing half piece of a halfplain bearing, which is adapted to place said bearing half piece of the half plain bearing ina bearing half piece supporting body, to apply a load to said bearing half piece so thatone abutting surface is compressed, and to measure said average interferences and saidinclinations of abutting surfaces using a pair of dimension measuring instruments.
申请人：DAIDO METAL COMPANY, LTD.
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