专利名称：Testing of integrated circuit receivers发明人：Tony M. Tarango,Ronald W. Swartz申请号：US10813144申请日：20040330
公开号：US20050251710A1公开日：20051110
专利附图：
摘要：A method for testing a data recovery circuit (DRC) includes disturbing a runningvariable in a closed control loop of the DRC, as the DRC is processing a received testsignal. Data recovered by the DRC, while the DRC was affected by the disturbance, isevaluated. Other embodiments are also described and claimed.
申请人：Tony M. Tarango,Ronald W. Swartz
地址：Folsom CA US,Granite Bay CA US
国籍：US,US
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